Measurement of the stimulated carrier lifetime in semiconductor optical amplifiers by four-wave mixing of polarized ASE noise

We present a simple experiment aimed at measuring the stimulated carrier lifetime in semiconductor optical amplifiers (SOA's). The technique relies on polarization-resolved nearly degenerate four-wave mixing (FWM) of a laser source with an amplified spontaneous emission (ASE) noise source. The method can quickly characterize the bandwidth performance of active layers for application in a cross-gain or cross-phase wavelength converter.