Millimeter-wave and power characterization for integrated circuits

This paper presents a training in characterization of integrated circuits for millimeter-wave and power applications. The goal of this training is to initiate the student to millimeter-wave measurements. The training is based on high performance equipments like a VNA (Vector Network Analyzer) up to 110 GHz, two probe stations and a millimeter wave load-pull facility. The devices under test (DUT) are power amplifiers at 60 GHz and 77 GHz implemented in CMOS and BiCMOS technologies from STMicroelectronics on silicon substrate. Other radiofrequency component characterizations are also studied.