A tool for fast mismatch analysis of analog circuits

A tool is presented that evaluates statistical deviations in performance characteristics of analog circuits, starting from statistical deviations in the technological parameters of MOS transistors. Performance is demonstrated via the analysis of a Miller OTA in two different configurations and a linearized CMOS transconductor. The CPU time is reduced by a factor of 25 to 90 with respect to conventional Monte Carlo simulation, while maintaining similar accuracy in the computations.