Measuring the comprehensive dielectric permittivity by the directional effects method

The paper analyzes the existing method applied to measuring the real (/spl epsiv/') and imaginary (/spl epsiv/") comprehensive dielectric permittivity (CDP) components in the technological control of the properties inherent in substances and materials. Also, the paper describes the author's phase CDP component measurement method applied with respect to the central frequency and the LC-oscillation circuit transmission bandwidth values and in the cases when the electric field interacts and does not interact with an examined material and substance. The new method provides 3-5 times higher measurement accuracy than the resonance (amplitude) one.