CMOS-NDR transistor

In this paper, a novel device - MOS-NDR transistor is proposed and fabricated which is composed of four N-channel metal-oxide-semiconductor field effect-transistor (NMOS) devices. This MOS-NDR transistor could exhibit the negative differential resistance (NDR) characteristics similar to the conventional NDR device such as compound material based RTD (resonant tunneling diode) in the current-voltage characteristics by suitably modulating the MOS parameters, at the same time it could realize good modulation effect by the third terminal and has advantages of low working voltage (peak voltage V
_p
=0.7 V) and high PVCR (Peak to Valley Current Ratio) (nearly 10:1). The design and fabrication of this device are completely compatible with the standard 0.35 ¿m CMOS process, thus can considerably extend the functions of the CMOS circuits into new scope.