Application of MFM to Magnetic Recording: For D.C. Characterization

The magnetic field profiles of ferrite and MIG heads, and of magnetic media, were imaged by magnetic force microscopy (MFM) using a scanning tunneling microscope (STM) and a beam deflection sensor. On the basis of the profiles obtained, we discuss the force acting on the tip of the MFM and the magnetic structure of the tip. The MFM is a very powerful tool for observing detailed magnetic structures with high resolution without special sample preparation. However, some problems, considered in our conclusion, remain to be overcome.