Measurement techniques for characterizing platform interference issues

This paper describes several techniques for measuring and characterizing the interference potentials of notebooks and other handheld devices that incorporate wireless subsystems. The first technique uses a broadband TEM cell to measure the emissions of integrated circuits. The second measures the electric and magnetic fields at the surface of integrated circuits and helps in localizing the regions of highest emissions. The third technique involves the use of a wideband horn antenna with an aperture similar to the size of a notebook. This method can be used in a normal lab environment and does not require an expensive shielded room. This measurement approach allows for rapid comparison testing of platform radiated emissions due to either hardware or software variations.