Generation of EM Susceptibility Test Fields Using a Large Absorber-Loaded TEM Cell

This paper discusses the development of an electromagnetic simulator for accurate generation of broad-band suspectibility test fields within a shielded environment. The simulator consists of a large, 3 m X 3 m X 6 m, rectangular transverse electromagnetic (TEM) transmission cell that is loaded with RF absorber to suppress multimoding at frequencies above the cell's waveguide cutoff or resonant frequencies. The paper describes the measurement facility and technique, and the experimental verification of pertinent test paramenters such as system VSWR, insertion loss, and test field uniformity. The measurement system is anticipated to provide swept, automated susceptibility measurements of electronic equipment to CW, pulsed, and EMP fields within the frequency band, 10 kHz to 1 GHz.