Improved Built-In Self-Test of Sequential Circuits

In this paper, we present a new class of one-dimensional cellular automata (which can be considered as a special case of a two dimensional cellular automata) that shows better pseudo-randomness properties based on Knuth's empirical tests than linear hybrid cellular automata and linear feedback shift register. A theorem is given to calculate the number of distinct transitions and the effectiveness of our proposed cellular automata is investigated by using them as test pattern generators for built-in self-test of the ISCAS 89 benchmark circuits. Our experimental results show that our cellular automata produce better sequential fault coverage than linear feedback shift register and linear hybrid cellular automata.