A novel noise parameters extraction technique for microwave packaged FET

In this paper, a novel noise parameters extraction technique for microwave packaged FET is proposed. The noise parameters of packaged FET for the entire operating frequency band can be obtained from the four noise parameters measured at a single frequency or a few frequencies. The predicated results obtained with this method agree well with the measured data. As a result, the novel noise parameters extraction technique can be used to predict the noise with a minimum effort.<
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