On electron-beam Lorentz microscopy

A new analysis of the Lorentz deflection of an electron beam is presented which is particularly suitable for magnetic samples with open flux configurations. By using Amperian currents and Newton's Third Law it is shown that the electron deflection problem can be solved very simply without extensive mathematics. As an example, a permanently magnetized thin film, which simulates a recorded digital "bit" is considered. The electron beam deflection equations found are closely related to Karlqvist's well known forms for the fringing field above the gap of a writing head.<
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