Fabrication tolerance analysis of an OEIC passive duplexer

A simulation method has been developed to study the fabrication tolerances of a passive duplexer on InP substrate which could be a part of an optoelectronic integrated circuit (OEIC) module. This method, based on a Taylor's series expansion, is fast enough to estimate the effect produced on the crossover power when a simultaneous variation of the duplexer parameters take place. It seems to be very useful, particularly during a repetitive control of the device characteristics.<
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