Statistical subpixel pattern recognition by histograms

A new statistical pattern recognition method has been developed for detection, recognition or measurement of patterns which are (much) smaller than the measure of the elementary pixel windows in the image screen. In this measurement the gray-level histogram of the objects examined is compared with the simulated histograms of different (in type or size) possible objects, and the recognition (of shape or measure) is taken on the basis of the comparison. This method does not need ultra-precise movement of the scanning sensors or any additional hardwares. Moreover, the examined pattern should be randomly distributed on the screen, or a random movement of camera (or target or both) is needed. Effect of noises are analyzed, and filtering processes are suggested in the histogram domain. Several examples of different shapes are presented through simulations and experiments.<
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