An electronic model for the aging of ferroelectric capacitor ceramics

An alternative model of the aging of ferroelectric materials is presented which is based on the idea that a dominant role in this process is played by the potential barriers at the surface of the grains of a ceramic, which arise as a result of the capture of free charge carriers by deep surface traps. The existence of such barriers was confirmed by measurements of the temperature dependencies of the electronic work function of semiconducting ceramics. The surface photo-EMF spectra obtained point to the presence of electronic states in the forbidden gap in the near-surface region of the ceramic samples. In the framework of the model suggested, theoretical estimates of aging process variables are made which agree with experimental data.<
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