Statistical process control: practice and benefits

Statistical process control (SPC) is based on the control chart techniques which were developed by W.A. Shewhart in the late 1920s. There has been a renewal of interest in these techniques in the last decade largely due to the influence and example of Japanese quality management practice. The aims of SPC are to eliminate scrap and rework, to manufacture products 'right first time' and to continuously improve processes and products. In the paper the author describes the various control charts which can be used, but states that there is more to SPC than the introduction and use of control charts. Other techniques, including: data collection and analysis; Pareto analysis; scatter graphs; and brain storming must also be used. The control charts discussed are for process variables.<
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