Modeling temperature effects in the DC I-V characteristics of GaAs MESFET's

A simple model is presented to account for the main temperature effects influencing the DC performance of GaAs MESFETs. The model is based on a consistent solution of heat flow and current equations that accounts for nonuniform power dissipation within the device. The simulation results are satisfactorily compared with experimental data obtained with pulsed and DC measurements performed on conventional devices as well as on suitable test structures.<
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