Voltage-pulse induced time-domain depolarization for plasma-deposited organosilicon films

Measurements of the voltage-pulse-induced time-domain depolarization (VPITDD) were used to investigate plasma polymerized organosilicon films. It was found that the observed relaxations were related to bulk processes. A two-center model was proposed to describe this phenomenon. Poole-Frenkel centers and traps lying near the Poole-Frenkel energy level were attributed to the observed relaxations.<
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