Numerical Simulation of Shielding Current Density in High-Temperature Superconducting Thin Film

The numerical code has been developed for simulating the time evolution of the shielding current density in the high-temperature superconducting thin film. When the governing equation of the shielding current density is discretized by use of the finite element method and the completely implicit method, singular integrals appear as coefficients of the nonlinear system. In order to evaluate the coefficients accurately, the double exponential formula is applied to the singular integrals. As a result, the shielding current density can be calculated with a high accuracy. By using the code, the noncontact measurement method of the critical current density has been simulated successfully