Dynamic testing of analogue to digital converters

Describes a method for the generation of the transfer characteristic of an analogue to digital converter (ADC) at arbitrary frequency. The technique allows accurate estimation of many important converter parameters from a single test, providing designers with valuable insight into the cause of ADC errors, and is fast in production use. Some comparison are made between the new technique and more conventional methods of test. Requirements for, and example results from the use of the technique are presented.<
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