Gauss-Poisson joint distribution model for degradation failure

A high-energy-density self-healing metallized film pulse capacitor is the key component of the inertial confinement laser fusion facility. The reliability level of capacitors is connected with operating reliability and maintenance expenses of the entire system. By analyzing the degradation mechanism and characteristics of performance of metallized pulse capacitors, and by comparing to the Weibull distribution, this paper presents a Gauss-Poisson joint distribution model for degradation failure, which is used to model nondestructive testing. The Gauss-Poisson model is more precise than the Weibull model in processing degradation failure data. This technique can assess and verify the reliability level of the capacitors and also save testing cost. In addition, this model can be applied to evaluate and identify the reliability of other equipment with respect to the degradation mechanism.