Application of wavelet modulus maxima in microarray spots recognition

This paper presents a novel approach to recognize the microarray image spots. The approach is based on the detection of wavelet modulus maxima in the microarray images. The detected maxima is actually the contour of the spots and thus the spots are recognized precisely. Then, the intensities within the contour of the spots can be obtained with low error rate. The test results on example image show this is an effective approach, especially for those spots with low intensities.