Textured growth of multi-layered buffer layers on Ni tape by sol-gel process

Textured Cerium Oxide (CeO/sub 2/)/Yttrium-Stabilized Zirconia (YSZ)/CeO/sub 2/ buffer layers structure were grown by sol-gel dip coating process on bi-axially textured Ni tapes for processing of YBCO coated conductors. CeO/sub 2//YSZ/CeO/sub 2/ buffer layer structure has been demonstrated by vacuum techniques, but first time textured CeO/sub 2//YSZ/CeO/sub 2/ structure were grown by sol-gel on biaxially textured Ni tape. The buffer layer structure promoted c-axis oriented sol-gel YBCO films and prevented oxidation of nickel during YBCO processing. After each layer was coated, the layer was annealed. CeO/sub 2/ layers were annealed at 950 /spl deg/C for 30 min. and YSZ layers were annealed at 1150 /spl deg/C for 10 min. under 4% H/sub 2/ - Ar gas flow. Texture analysis of Ni substrates and bottom CeO/sub 2/ were done by Philips diffractometer. Sol-gel YBCO layers were coated on CeO/sub 2//YSZ/CeO/sub 2/ structure and critical current density was about 0.5 /spl times/ 10/sup 5/ A/cm/sup 2/. Microstructure of the buffer layer was investigated by Environmental Scanning Electron Microscope (ESEM).