High-Reliability Semiconductor Lasers for Optical Communications

InGaAsP/InP buried heterostructure (BH) lasers emitting at 1.3 μm have continued to operate stably for more than
3.3 \times 10^{4}
h (3.8 years) at 50-60°C and at an output power of 5 mW/facet. A statistically estimated median lifetime exceeds 10
⁶
at 50°C. A relatively low activation energy of 0.32 eV is obtained for slow degradation. The saturable behavior of the aging characteristics is observed in many of the lasers. This mode is explained by the increased leakage current through the buried regions, and can be eliminated by electroluminescence (EL) mode aging at high temperature and current. Distributed feedback (DFB) lasers emitting at 1.55 μm are also subjected to accelerated aging at 60°C with a 3 mW/facet output after EL-mode aging. These DFB lasers demonstrate stable aging characteristics, for more than 2000 h of operating time being currently achieved.