Characterization of the random array peak sidelobe

Upper bounds on the height of the peak sidelobe of the random array are derived using the theory of level crossings of a random process. Statistical properties of the random array beam pattern are presented and are used to calculate the expected number of up-crossings of a given level by the power pattern. Upper bounds on the peak sidelobe height are obtained using the expected number of up-crossings. The bounds are compared with computer simulation results.