Application of a surface integration technique to parallel-plate waveguide radiation-pattern analysis

A surface integration technique is presented which extends the usefulness of high-frequency diffraction methods. This technique is used in conjunction with wedge-diffraction theory to analyze the TEM radiation patterns of parallel-plate waveguides. The surface integral is obtained by Green's second identity. The fields on the surface are calculated by the wedge-diffraction method. This technique provides an improvement in the accuracy of the pattern as compared to the wedge-diffraction method.