A Simplified Large-Signal Simulation of a Lumped Element TEO Based on a Phase Plane Technique

The transferred electron device (TED) lumped circuit interaction is modeled by a phase plane technique. The results from this large-signal simulation are compared to those from a time-domain simulation based on the electron transport equations and are shown to be in good agreement. Results from the simulations are used as the design specifications for a J-band MIC TEO with excellent results indicating the potential of this CAD technique.