A Combined Model for Transient and Self-Heating of Snapback Type ESD Protection Devices

A simplified physics-based model for predicting the transient response and self-heating behavior of silicon-controlled rectifier (SCR) snapback-type transient voltage suppressors (TVS) is presented. Comparisons of the predicted quasi-static behavior and transient waveforms with measurements suggest that the proposed model accurately captures the most important characteristics of the device. Its simplified nature means it can be easily tuned using only data obtained from package-level measurements.