Monte Carlo simulation for the prediction of the emission level from multiple sources inside shielded enclosures

The emission level from multiple sources inside shielded enclosures is presented. Fields are expressed through the dyadic Green's function. Integrated circuits are modeled as electric and magnetic dipoles. Induced electric current magnitudes on the walls of the enclosures are analytically calculated. Probabilistic models based on measurement data for various source configurations are derived and Monte Carlo simulations are produced. The results are used for the prediction of possible emission margins. Applications in PCB design are discussed and suggestions are made.