Modeling of stress effects on magnetic hysteresis and Barkhausen emission using an integrated hysteretic-stochastic model

Summary form only given. An integrated magnetic hysteresis and Barkhausen effect (BE) model has been developed which provides a coherent description of the effects of stress on hysteresis loop and BE signals. To verify the model predictions hysteresis loops and BE signals were measured and simulated for steel under various tensile and compressive stresses within the elastic limit. BE signal was calculated based on the hysteretic-stochastic process model of domain wall dynamics, which has been recently developed for description of BE signal over the entire hysteresis cycle in which the permeability varies with applied field and stress. The BE signal voltage, which corresponds to the rate of irreversible changes in magnetization I/spl dot//sub irr/ is governed by d I/spl dot//sub 1rr//dt = /spl chi//sub 1rr///spl tau/ ((dH/sub a//dt) - (dH/sub o//dt)) /spl dot//sub 1rr///spl tau/, where H/sub a/ is the applied field, H/sub C/ is the local pinning field, /spl chi/'/sub 1rr/ is the irreversible susceptibility and /spl tau/ is proportional to /spl chi/'/sub 1rr/. An applied stress /spl sigma/ was treated as an effective field operating through the magnetostriction /spl lambda/. In this approach the stress effect on BE signal can be described via /spl chi/'/sub 1rr/ which is given by /spl chi/'/sub 1rr/ = /spl chi//sub 0/ (1 + (M/sub a/ - M/sub 1rr/)/(k/spl delta///spl mu//sub 0/) [/spl alpha/ + (3/spl sigma//2/spl mu//sub 0/)(/spl part//sup 2/ /spl lambda///spl part/M/sup 2/)](M/sub a/ - M/sub 1rr/)). The simulated hysteresis loop parameters such as the coercivity and remanence and the rms BE signal voltage were found to exhibit a stress dependence consistent with that of the experimental data, indicating that the integrated model can be used to describe the trends in the behavior of both hysteresis loop and BE signal as a function of stress.