Fault Injection of Strong Magnetic Pulse in Digital Integrated Circuit

As the electromagnetic environment of electronic equipment becomes more complex and the chip area increases, the research of integrated circuit electromagnetic compatibility (EMC) technology is taken seriously. The development of new technologies represented by electromagnetic pulse weapons, electromagnetic artillery, and high-power wireless charging technologies for mobile phones has made the integrated circuit as the control core face the challenge of complex and harsh electromagnetic interference (EMI). Based on the strong magnetic pulse (SMP) environment generated by the electromagnetic artillery, this paper analyzes the interference mechanism of the SMP to the digital integrated circuit, and conducts the simulation experiment of the SMP fault injection in the SPICE simulation software.