Towards Polarization-Resolved all-Electronic Thz-Nanoscopy

We report on a polarization resolving 600 GHz scattering-type THz nanoscope (THz-s-SNOM) based on independent all-electronic emitter and detector units. This system is capable of measuring the in-plane and out-of-plane near-field components independently from the polarization of the emitter. Polarization dependent approach curves with a high S/N are shown, experimentally verifying the polarization selectivity of our system for THz-nanoscopy applications.