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Atom interferometer inertial force sensors | IEEE Conference Publication | IEEE Xplore

Atom interferometer inertial force sensors


Abstract:

We report on the progress in the development of high sensitivity and accuracy inertial force sensors which are based on atom interference techniques.

Abstract:

We report on the progress in the development of high sensitivity and accuracy inertial force sensors which are based on atom interference techniques.
Date of Conference: 13-16 March 2000
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-5872-4
Conference Location: San Diego, CA, USA

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