Abstract:
We report on the progress in the development of high sensitivity and accuracy inertial force sensors which are based on atom interference techniques.Metadata
Abstract:
We report on the progress in the development of high sensitivity and accuracy inertial force sensors which are based on atom interference techniques.
Date of Conference: 13-16 March 2000
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-5872-4