Abstract:
The paper presents test-setup and results of technical experiments carried out in order to demonstrate ambiguities in the EMC generic immunity test standards of IEC 61000...Show MoreMetadata
Abstract:
The paper presents test-setup and results of technical experiments carried out in order to demonstrate ambiguities in the EMC generic immunity test standards of IEC 61000-6-x series. These ambiguities result from application of undefined type of AC/DC power supply during Electrical Fast Transient / BURST immunity test. Authors showed that such approach may cause different test results and proposed relevant changes in the standards.
Published in: 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
Date of Conference: 07-11 August 2017
Date Added to IEEE Xplore: 23 October 2017
ISBN Information:
Electronic ISSN: 2158-1118
