Hybrid CMOS-OxRAM RNG circuits

Compact, low-power random number generators (RNG) are essential for applications such as stochastic, bio-inspired-computing and secure system data encryption/communication. We demonstrate for the first time highly scalable RNG circuits based on the reset-state transient current fluctuation of resistive switching OxRAM devices. We propose- (i) single OxRAM based pseudo-random number generator (PRNG) and (ii) 2-OxRAM based true-random number generator (TRNG) circuits. The proposed hybrid RNG circuits have been validated for 10 nm thick HfOx devices at 180 nm CMOS node. Chi-square test, serial spectral test and covariance/correlation-based analysis are performed to analyze the performance of the proposed hybrid RNG nanocircuits.