A new variational method to determine effective channel length and series resistance of MOSFET's

A new variational method to determine the effective channel length and the series resistance of MOSFETs is proposed. It is analytically shown that there is nothing well defined, except for effective channel length at V/sub gt/=0 in the resistance-based method. The new method yields constant effective channel length in the neighborhood of V/sub gs/=V/sub th/ and series resistance dependent on the gate voltage. The new method is well defined and gives accurate and consistent effective channel length and series resistance.