I. Introduction
The structural elements in many microelectromechanical systems (MEMS)-based sensors and actuators, e.g., polysilicon beams in accelerometers and metal torsion bars in digital mirrors, are subjected to billions of load cycles without fatigue failures. However, some transducers require lifetimes of less than 1000 cycles—an example being safing-and-arming systems [1]. Fatigue testing is normally conducted under stress control for long lifetimes and strain control for short lifetimes, but to-date fatigue testing of MEMS structures has predominantly been conducted under stress control. This letter demonstrates an optical system for measuring and controlling cyclic strain in specimens of the same size scale as MEMS products.