Abstract:
This paper proposes a simple test circuit for characterization of MOS transistor mismatch in a standard 2 /spl mu/m CMOS technology. Measurements have been performed both...Show MoreMetadata
Abstract:
This paper proposes a simple test circuit for characterization of MOS transistor mismatch in a standard 2 /spl mu/m CMOS technology. Measurements have been performed both in the saturation and subthreshold regimes in order to obtain an accurate characterization in a wide range of operations. The parameter mismatch estimation algorithm is based on Multiple Linear Regression and is able to furnish information on the estimation accuracy.
Date of Conference: 17-20 March 1997
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-3243-1