Abstract:
The product failures voltage acceleration has traditionally been modelled with exponential voltage dependence. However with voltage scaling, the voltage acceleration para...Show MoreMetadata
Abstract:
The product failures voltage acceleration has traditionally been modelled with exponential voltage dependence. However with voltage scaling, the voltage acceleration parameter (VAP) in an exponential model has increased as V−1 - as expected for dielectric breakdown in either back-end or front-end. This suggests an exponential model is probably quite conservative and a power-law model may be more appropriate for 90nm and beyond. Even if an exponential model continues to be used, this understanding can help assess the amount of conservatism built in such a model.
Published in: 2010 IEEE International Reliability Physics Symposium
Date of Conference: 02-06 May 2010
Date Added to IEEE Xplore: 17 June 2010
ISBN Information: