Compact modeling of flicker noise variability in small size MOSFETs

A compact model has been developed to capture the variability of flicker noise resulting from the reduction in size of state of the art MOSFETs. The underlying physics of flicker noise in small area MOSFETs has been verified by two means: Monte Carlo simulation and analytic modeling. The statistical distribution of flicker noise is reported for the first time, supported by experimental data from two sets of devices with different areas. The developed model is capable of predicting the area dependence of noise at any frequency at desired %Yield.