Measurement of dielectric property distributions using interdigital dielectrometry sensors

Estimation of physical properties of insulating materials may effectively be done by using nondestructive /spl omega/-k (frequency-wavelength) dielectrometry technology. Essential to this technology are pairs of interdigitated electrodes, which respond to the change in resistive and capacitive properties of the surrounding media. This paper presents both experimental and theoretical data, which helps to investigate the ability of the sensor to characterize multi-layered insulating and semi-insulating materials. Issues of precision and reliability of the measurements are discussed.