Abstract:
A Fraunhofer far-field holographic technique has been used to develop a method which allows the size of particles of contaminants in an HV XLPE (high-voltage cross-linked...Show MoreMetadata
Abstract:
A Fraunhofer far-field holographic technique has been used to develop a method which allows the size of particles of contaminants in an HV XLPE (high-voltage cross-linked polyethylene) cable insulating layer to be determined without cutting it into thin slices. The cable samples can be as thick as 4.0 cm when a resolution of 50 mu m is achieved. The accuracy of the proposed method is within 10% for particles larger than 20 mu m in diameter.<>
Published in: Proceedings., Second International Conference on Properties and Applications of Dielectric Materials
Date of Conference: 12-16 September 1988
Date Added to IEEE Xplore: 06 August 2002
