Semiconductor device parameter extraction based on reconfigurable ring oscillator frequency measurements

The authors discuss an extended parameter extraction procedure including the program PETRA (parameter extraction based on transient ring analysis) for the evaluation of measured data on the reconfigurable ring oscillator (RRO). The measurement data and their evaluation are presented. The improved model parameters delivered by this program increase the accuracy of the propagation delay-time simulation for dynamic-type CMOS logic cells. The benefits of the proposed method are due to the high measurement accuracy of the oscillation frequency of the RRO and the sophisticated computer work for iteration of the optimum set of model parameters.<
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