Abstract:
We have developed a new device structure for high-performance and high-power mixed signal LSIs using 0.35 /spl mu/m SOI complementary bipolar transistors. The new structu...Show MoreMetadata
Abstract:
We have developed a new device structure for high-performance and high-power mixed signal LSIs using 0.35 /spl mu/m SOI complementary bipolar transistors. The new structure is composed of array transistors for various operating currents and a flexible U-groove layout for high-power transistors. Thermal simulation and test structure measurements showed the advantage of the new structure quantitatively.
Published in: Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516)
Date of Conference: 22-25 March 2004
Date Added to IEEE Xplore: 06 July 2004
Print ISBN:0-7803-8262-5