Abstract:
A new test circuit is proposed for measuring the standard deviations of both MOSFET channel conductance and threshold voltage. This test circuit consists of the matrix-sh...Show MoreMetadata
Abstract:
A new test circuit is proposed for measuring the standard deviations of both MOSFET channel conductance and threshold voltage. This test circuit consists of the matrix-shape MOSFET array in which several switches and wiring are added. DC currents flowing through this array are measured, changing the ON/OFF states of the switches, and then the standard deviations are calculated from them.
Published in: Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.
Date of Conference: 11-11 April 2002
Date Added to IEEE Xplore: 08 April 2003
Print ISBN:0-7803-7464-9
Contents 