Abstract:
An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This tes...Show MoreScope:The scope of this standard is the definition of an exchange format, utilizing XML, for exchanging the test station information by defining the description of the test sta...Show More
Purpose:The purpose of this standard is to provide a standardized format to promote and facilitate interoperability between components of non-manual test systems, by allowing exc...Show More
Metadata
Abstract:
An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.
Scope:
The scope of this standard is the definition of an exchange format, utilizing XML, for exchanging the test station information by defining the description of the test station (e.g., physical and electrical characteristics, components, capabilities/performance, and identification/classification).
Purpose:
The purpose of this standard is to provide a standardized format to promote and facilitate interoperability between components of non-manual test systems, by allowing exchange of test station information. The Test Station Schema becomes a class of information that can be used within the ATML family of standards. Each instance document contains the definition of a single test station model. The Test Station schema provides a structure for describing test station capabilities and structure. This standard will allow common test station information to be transportable across a variety of ATE within the automotive, semiconductor, aerospace and military industries.
Date of Publication: 01 February 2013
Electronic ISBN:978-0-7381-5808-2
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=4723925
