The Direct Spectral Projection Model for Electromagnetic Scattering | IEEE Conference Publication | IEEE Xplore

The Direct Spectral Projection Model for Electromagnetic Scattering


Abstract:

The spectral projection model (SPM) was presented in two previous papers as a fast and accurate method for analyzing electromagnetic scattering from two-dimensional surfa...Show More

Abstract:

The spectral projection model (SPM) was presented in two previous papers as a fast and accurate method for analyzing electromagnetic scattering from two-dimensional surfaces [1], [2]. SPM is derived by applying the addition theorem for Bessel and Hankel functions to the specific integral equation, which describes the boundary conditions associated with the scattering problem. In this paper, SPM is manipulated further to derive a set of eigen functions, which describe the solutions to the specific scattering problem. Each eigen function, represented by a particular source and corresponding induced current, may be viewed as a stand-alone solution to the problem at hand, i.e. satisfy the boundary conditions. In the Direct Spectral Projection Model (DSPM), the solution to the scattering problem is derived by decomposing the incident fields in terms of these eigen functions. This decomposition is achieved by equating the spectral signatures of the incident sources to the weighted sum of the spectral signatures of eigen function sources. Simulations are conducted using DSPM for a variety of conducting cylinders with different cross-sectional shapes, for both TM and TE polarizations. The results are compared with those from SPM and the Method of Moments (MoM). The simulations compare well with the results generated by SPM and MoM and provide validation of DSPM.
Date of Conference: 23-28 July 2023
Date Added to IEEE Xplore: 07 September 2023
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Conference Location: Portland, OR, USA

I. Introduction

The spectral projection model (SPM) was developed with the goal of relating the electromagnetic scattering to the physical properties of a target or surface [1], [2]. In SPM, the addition theorem for Bessel and Hankel functions [3] is employed to describe the relationship between source currents and the corresponding induced fields as a projection of spectral signatures [1], [2]. The field at an observation point is written as the projection of the spectral signature representing the source point on to the spectral signature representing the observations point where the field is to be estimated. For two-dimensional objects, these spectral signatures are described as vectors in terms of Bessel or Hankel functions and the appropriate trigonometric functions [1].

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