Implementation of printed-AlOx PERC technology on multi-crystalline silicon solar cells: Impact of wafer quality

In this paper we implement our newly developed printed-AlOx PERC technology (ExcelTon™-III) on multi-crystalline silicon (mc-Si) solar cells. Using the ExcelTon™-III technology, efficiency gains of 0.7-0.9% compared to conventional single-crystalline silicon (c-Si) solar cells had been achieved. The current work is focus on studying what efficiency gains on mc-Si cells can be achieved as well as the impact of wafer quality on cell efficiency. The results indicate that the efficiency gains on mc-Si cells are significantly influenced by wafer quality. A larger variance of efficiency gains of 0.37-0.85% was observed even on the so-called high-performance mc-Si wafers. The best median efficiency of 18.77% with the champion efficiency of 18.83% was achieved in this preliminary study.