Sensing an electron cloud emanating from a microchannel plate stack

Microchannel plates (MCPs) are routinely used in the detection of photons, electrons, and ions. Due to their high amplification and excellent timing characteristics they are particularly useful in the detection of a single photon, electron, or ion. In addition to sub-nanosecond time resolution, MCP detectors can also provide position resolution making them useful in imaging applications. In the described approach, the position of the incident particle is determined by sensing the electron cloud as it emanates from a MCP stack. The bipolar nature of the induced signals provides a particularly unique signal. By coupling a sense wire plane to a delay line a position resolution of 466 pm has been achieved. A setup to characterize the dependence of the induced signals on the position and magnitude of the electron cloud, through an independent measurement of its position, is presented. A second generation prototype detector which employs a differential approach is also described.