Voltage regulator bin failure improved by optimized circuit layout and novel laser anneal process

Voltage regulators are widely used in a circuit design nowadays. Voltage regulator failure is a critical yield loss in advanced technology nodes. Through a comprehensive study on circuit layout and process optimization, we demonstrated that voltage regulator failure can be tremendously reduced by optimizing the voltage regulators in circuit layout and using the novel laser anneal recipe. These two approaches can be further implemented in more advanced technology nodes.