Stochastic EMI sources localization based on ultra wide band near-field measurements

A localization technique for stochastic EMI sources based on time domain measurements of EM near-field tangential components is presented. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. The main limitations for scanning parameters are discussed. The case study for a frequency and spatial localizations of equivalent point sources is presented based on the modeling and measurement results.